PUCA: Patch-Unshuffle and Channel Attention for Enhanced Self-Supervised Image Denoising

Authors: Hyemi Jang, Junsung Park, Dahuin Jung, Jaihyun Lew, Ho Bae, Sungroh Yoon

NeurIPS 2023 | Conference PDF | Archive PDF | Plain Text | LLM Run Details

Reproducibility Variable Result LLM Response
Research Type Experimental Experimental results demonstrate that PUCA achieves state-of-the-art performance, outperforming existing methods in self-supervised image denoising.
Researcher Affiliation Academia Hyemi Jang1, Junsung Park1, Dahuin Jung1, Jaihyun Lew2, Ho Bae3, , Sungroh Yoon1,2, 1Department of Electrical and Computer Engineering, Seoul National University 2Interdisciplinary Program in Artificial Intelligence, Seoul National University 3Department of Cyber Security, Ewha Womans University
Pseudocode No The paper does not contain any sections explicitly labeled 'Pseudocode' or 'Algorithm', nor does it present any structured, code-like steps for its method.
Open Source Code Yes Code is available at https://github.com/Hyemi Esme/PUCA
Open Datasets Yes Smartphone Image Denoising Dataset (SIDD) [1] is a collection of real-world images for denoising captured by five different smartphone cameras. Specifically, the SIDD-Medium dataset consists of 320 pairs of noisy and clean images for training purposes. Darmstadt Noise Dataset (DND) [26] is a dataset used for benchmarking image denoising algorithms.
Dataset Splits Yes In addition, the SIDD validation set and benchmark set are used for validation and evaluation, respectively. Both sets consist of 1,280 noisy patches with a size of 256 256, and corresponding clean images are provided only for the validation set.
Hardware Specification Yes We trained the model using an NVIDIA TESLA P100 GPU
Software Dependencies Yes implemented it with Pytorch 2.0.0.
Experiment Setup Yes The model was trained with L1 loss between the input noisy image and the output, using Adam optimizer with an initial learning rate of 1e-4. We trained the model for 20 epochs until it fully converged. More detailed information can be found in our supplementary material.