Learnability of the Superset Label Learning Problem

Authors: Liping Liu, Thomas Dietterich

ICML 2014 | Conference PDF | Archive PDF | Plain Text | LLM Run Details

Reproducibility Variable Result LLM Response
Research Type Theoretical In this paper, we analyze Empirical Risk Minimizing learners that use the superset error as the empirical risk measure. SLL data can arise either in the form of independent instances or as multiple-instance bags. For both scenarios, we give the conditions for ERM learnability and sample complexity for the realizable case.
Researcher Affiliation Academia Li-Ping Liu LIULI@EECS.OREGONSTATE.EDU Thomas G. Dietterich TGD@EECS.OREGONSTATE.EDU School of Electrical Engineering and Computer Science, Oregon State University, Corvallis, Oregon 97331, USA
Pseudocode No The paper does not contain any structured pseudocode or algorithm blocks.
Open Source Code No The paper does not include any statement about releasing source code for the described methodology, nor does it provide a link to a code repository.
Open Datasets No The paper is theoretical and describes abstract
Dataset Splits No The paper is theoretical and does not describe any experiments using real-world data, therefore no dataset splits for training, validation, or testing are mentioned.
Hardware Specification No The paper focuses on theoretical analysis and does not describe any experimental setups or computational hardware used.
Software Dependencies No The paper is theoretical and does not detail any software dependencies with specific version numbers, as it does not involve implementation or experimentation.
Experiment Setup No The paper is entirely theoretical and does not describe any experimental setup details, hyperparameters, or training configurations.